Scanning Electron Microscope Laboratory
The Scanning Electron Microscope Lab is located in Room 2-17 in the Earth Sciences Building. We have 2 SEMs in our facility: a JEOL 6301F and a Zeiss EVO MA 15. Our JEOL (Field Emission Scanning Electron Microscope) provides high-resolution digital images of surface textures and microstructures, at magnifications ranging from 20x to 250,000x with a resolution of approximately ~3 nm (sample dependent). Semi-quantitative elemental analysis is available via a PGT X-ray analysis system (res. 135 eV). Our Zeiss EVO SEM with LaB6 crystal source provides images from 20x to 100 000x with a resolution of ~5 nm. It is equipped with a Bruker Silicon Drift Detector for Energy Dispersive X-Ray analysis/ mapping with a peak resolution of 125 eV. Frozen samples can be examined using the Emitek K1250 cryogenic system. For sample preparation, the facility has a Bal-Tec CPD 030 critical point dryer. Conductive coatings of gold, chrome, silver, iridium or copper can be applied using our Xenosput XE200 or Nanotek SEMprep 2 sputter coaters. Alternatively, carbon coating using our Leica EM SCD005 evaporative carbon coater is also possible.
This facility is used by both local and international university researchers as well as by industry and various government agencies. Research conducted here ranges in diversity from geological to agricultural, biological, medical and nanotechnological applications. Image output is in the form of high-quality wax jet prints, and digital images are available for download through an SFTP server.
Ideally, samples should be conductive, less than 1.5 cm in diameter and 1 cm high. Samples should also be dry enough to withstand vacuums of at least 10-7 Torr, but almost any type of sample can be prepared for examination with the SEM.
For Appointments, call 780 492 5746 or e-mail email@example.com